ICP-OES instruments are utilized globally in the product control of steel: however, alternative techniques are often consulted where highest precision and lowest detection limits are essential. For the analysis of critical elemnts like Iridium signal suppression and spectral interferences often lead to poor detectibility on conventional ICP-OES instruments. The unique sensitivity of high-resolution array ICP-OES was tested in the specification analysis of precious metals in iron-nickel-chromium alloys.
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