Elucidating the structure of mesoporous silica

X-ray diffraction measurements were carried out on two types of MCM-41. The d values in Fig. 1 do not arise from the atomic structure. They arise from the arrangement of the skeletal structure of the material, and therefore the values are large. As a result, the observed diffraction lines appear on the low angle side, as shown in Fig. 2. Transmission method measurement employing a small-angle optical system is also sometimes used with these samples, but measurement can also be done with a reflection method using a D/teX Ultra the high-speed 1D X-ray detector. As shown in Fig. 2, there is little statistical fluctuation, even with measurement time of 1 minute or less, and the minimum peak positions of d2 and d3 on the large-angle side can be clearly calculated. As shown in Table 1, the relative d values matched theoretical values for both Sample 1 and 2.

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