Examination of the Growth Process of an Organic Thin Film by In-Plane XRD

The organic semiconductor pentacene has attracted a lot of attention for potential use in TFT (thin film
transistor) due to its high carrier mobility which approaches that of amorphous Si. However, controlling the
crystal phase and molecular orientation in the pentacene thin film is essential to obtain optimal characteristics.
In this example, we perform phase identification and evaluation of orientation of the pentacene molecules in
thin films different in thicknesses as well as crystallite size determination.

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