Phase ID of organic thin film by GI-WAXS with 2D detector

The grazing incidence wide angle X-ray scattering (GI-WAXS) technique, where an incident X-ray beam
strikes a specimen surface at a very shallow angle, is often employed for the measurement of ultra-thin film
specimens, since their very weak signals can be effectively observed this way. The combination of the
2D-SAXS/WAXS attachment with an aperture slit and a 2D detector allows clearly resolved 2D diffracted
images to be obtained using a general X-ray diffractometer with a line-shaped incident beam

Contact us now >

Or call us now on 0161 442 9963 to speak to a Product Specialist.