Quantitative analysis of a 4-component sample using a benchtop X-ray diffractometer

In the past, quantitative analysis with X-ray diffractometry was performed using calibration curves, but due to the
progress of computers and analysis software, quantitative analysis using the WPPF (Whole Powder Pattern Fitting)
method has now come into wide use. In the WPPF method, profile fitting is performed over a comparatively broad
angular range, based on information involving the crystal system and lattice constants. Since diffraction intensity can be refined at the same time as the diffraction angle, quantitative analysis can be done without the need for calibration curves.

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