TXRF Benchtop

Total reflection X-ray fluorescence (TXRF) spectrometers are specifically designed to offer comprehensive trace element and materials characterization analysis capabilities to a broader range of research disciplines

Nanohunter II

Description Features Description NanoHunter II: NEW Benchtop total reflection X-ray Fluorescence (TXRF) spectrometer The new NanoHunter II. The Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to offer comprehensive trace element and materials characterization analysis capabilities to a broader range of research disciplines, and in more diverse analytical settings, than was possible with previous technology. Whether for geologists, chemists, biochemists, biologists, materials scientists and engineers, non-destructive trace element analysis is attainable, with minimal to no sample preparation, for applications that span from metallo-protein research to environmental assessment and semiconductor wafer metrology. With its new high…