NEW Benchtop total reflection X-ray Fluorescence (TXRF) spectrometer
The new NanoHunter II.
The Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to offer comprehensive trace element and materials characterization analysis capabilities to a broader range of research disciplines, and in more diverse analytical settings, than was possible with previous technology. Whether for geologists, chemists, biochemists, biologists, materials scientists and engineers, non-destructive trace element analysis is attainable, with minimal to no sample preparation, for applications that span from metallo-protein research to environmental assessment and semiconductor wafer metrology.
With its new high performance crystals, the sensitivity of toxic metals such as As and Cd are vastly improved.
Further performance is achieved with its 600W tube excitation up to high voltages
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