CIQTEK HEM6000 SEM
The CIQTEK HEM6000 SEM delivers high-speed electron microscopy for rapid SEM sample analysis, materials science, and semiconductor failure detection.
Product Overview
The HEM6000 is a high-speed scanning electron microscope equipped with advanced features specifically designed to enable a new paradigm in high throughput EM applications.
It utilises a high-brightness large-beam current electron gun and an immersion electromagnetic & electrostatic combo objective lens for nano-scale resolution with fast image acquisition. The dynamic optical axis and high-voltage sample stage deceleration ensure precise imaging.
It also incorporates a fully electrostatic high-speed beam deflection system for optimal resolution. The HEM6000 supports automated operation with a smart workflow, and features automated image stitching and 3D reconstruction for large field-of-view imaging with minimal distortion.
Features & Benefits
Ultra-Fast Imaging: High-speed data acquisition for rapid results.
Precision Analysis: Unrivalled resolution in high throughput imaging.
High-Throughput Capability: Increased efficiency for semicondutor industrial applications.
Key Features
- High-brightness electron gun for TEM quality high contrast imaging.
- Nano-scale resolution with high-speed image acquisition
- Immersion electromagnetic & electrostatic combo lens for fast, precise imaging.
- Dynamic optical axis for low aberration imaging over large fields of view.
- High-voltage sample stage deceleration for enhanced image quality at low voltages.
- Electrostatic high-speed beam deflection system for high-speed beam performance.
- Dwell time of 10 ns/pixel for ultra-fast image acquisition.
- Automated operation process streamlines workflows.
- Automated image stitching for seamless large-area imaging.
- 24/7 continuous operation ensures non-stop functionality.
CIQTEK HEM6000 SEM Product Video
About the CIQTEK HEM6000 SEM
The HEM6000 is a high-performance scanning electron microscope tailored for volumetric electron microscopy, making it ideal for 3D tissue reconstruction and biological research. Its advanced imaging system is equipped with a high-brightness electron gun and immersion electromagnetic and electrostatic lenses for fast, high-resolution imaging. This microscope excels in automated operation, facilitating continuous 24/7 use in research environments.
Its high-speed beam deflection and ultra-fast dwell time allow for rapid scanning, ideal for volumetric imaging, where high throughput is needed.
The automated image stitching and 3D reconstruction capabilities enable seamless integration of data, making it perfect for creating detailed, three-dimensional tissue maps. Users need simply load a sample wafer and return to see the completed results.
This system’s ability to handle large fields of view (64µm2) with minimal distortion makes it especially valuable in mapping large areas to nanometer resolution, offering insights into tissue structures at the nanoscale. The high-voltage sample stage deceleration ensures that delicate biological samples are imaged with exceptional detail, while the dynamic optical axis maintains the precision needed for accurate reconstructions. Whether for detailed tissue analysis or high-throughput scanning, the HEM6000 provides the tools necessary for advanced biological research and semiconductors analysis.
Image Gallery
IC Chip (Metal layer) 116x BSE 120 ns
IC Chip (Device layer) 2,000x BSE 40 ns
IC Chip (Metal layer) 96x BSE 80 ns
IC Chip (Metal layer) 1,000x BSE 40 ns
Biopsy Section 9,500x BSE 120 ns
Biopsy Section 10,000x BSE 120 ns
Biopsy Section 10,000x BSE 120 ns
Biopsy Section 116x BSE 120 ns
Glomerulus 1,800x BSE 120ns
Testicular Section 9,500x BSE 120ns
Renal Pathology Section 40,000X STEM 320ns
Renal Pathology Section 38,571x STEM 320ns
The CIQTEK HEM6000 is a high-speed SEM offering 0.9 nm resolution for detailed imaging in materials, semiconductors, and geology.
Product FAQ's
The HEM6000 offers high-speed SEM imaging, advanced automation, and next-generation SEM technology for rapid sample analysis.
It is ideal for volumetric electron microscopy, biological research, 3D tissue analysis, and nanotechnology.
Yes, the HEM6000 has wide-ranging applications across a number of industries where imaging of large volumes to ultra-fine resolution is required, such as reverse engineering of PCBs.
It streamlines workflow by reducing manual input, improving consistency, and accelerating image acquisition.
Absolutely. It is a high-throughput scanning electron microscope designed for rapid SEM sample analysis in research and industry.
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