CIQTEK SEM3300
The CIQTEK SEM3300 SEM is the first of its kind ultra-high resolution scanning electron microscope. Providing 2.5nm resolution and in-lens detectors in an easily maintained tungsten filament column design
Product Overview
The CIQTEK SEM3300 is the world’s first tungsten filament SEM with 2.5nm resolution, delivering unmatched imaging precision. Its in-lens detector enhances contrast and detection efficiency, making it ideal for high-level material analysis.
Optimised for battery material analysis, it provides clear imaging of lithium battery diaphragms with sharp pore structures. Low voltage imaging ensures detailed observation of delicate samples without damage. The large sample chamber supports specimens up to 370mm, allowing greater flexibility.
Combining groundbreaking resolution, advanced detection, and user-friendly operation, the SEM3300 sets a new standard in scientific and industrial electron microscopy.
Features & Benefits
2.5nm Resolution
High-precision imaging with ultra-fine detail.
In-Lens Detector
Enhanced contrast and detection efficiency.
Battery Material Analysis
Ideal for lithium battery diaphragm imaging
Key Features
- Ultra-High Resolution: Achieves a resolution of 2.5 nm at 20 kV, surpassing traditional tungsten filament SEMs.
- In-Lens Electron Detector: Enhances detection efficiency and imaging quality by integrating the detector within the electron optics system.
- Electrostatic & Electromagnetic Compound Objective Lens: Combines electrostatic and electromagnetic fields to improve focus precision and image clarity.
- Low Voltage, High-Resolution Imaging: Delivers detailed images at low acceleration voltages, suitable for sensitive sample analysis.
- Ideal for Battery Material Analysis: Effectively images lithium battery diaphragms, revealing clear pore structures and sharp edges.
- Super-Tunnel Electron Optics: Incorporates advanced electron optics technology to enhance imaging performance.
- User-Friendly Interface: Features intuitive controls and software for streamlined operation.
- Large Capacity Sample Chamber: Accommodates samples up to 370 mm in diameter without the need for cutting.
- Versatile Imaging Capabilities: Suitable for a wide range of applications, including materials science, biology, and nanotechnology.
An Introduction to CIQTEK Scanning Electron Microscope SEM3300
About the CIQTEK SEM3300
The CIQTEK SEM3300 SEM is an innovative tungsten filament scanning electron microscope engineered to provide high-resolution imaging for research, education, and industrial applications. Traditional SEM systems often come with high costs and complex operation, making them inaccessible to many laboratories and manufacturers. The SEM3300 solves this problem by offering an affordable SEM for material analysis, making advanced imaging technology available to a broader range of users.
One of the biggest challenges in materials science and industrial production is ensuring quality control and failure analysis with high accuracy. The SEM3300 is designed as a scanning electron microscope for failure analysis, providing detailed surface morphology imaging to detect defects, inconsistencies, and material failures. This makes it an essential tool for manufacturers who need to maintain high production standards, ensuring the integrity of components and finished products.
For academic institutions, the SEM3300 serves as an entry-level SEM for research and education, offering intuitive operation that allows students and researchers to gain hands-on experience with advanced imaging techniques. Its compact tungsten filament SEM for laboratories design ensures that even small research facilities can accommodate high-performance imaging technology. The best tungsten filament SEM for imaging should combine ease of use with powerful capabilities, and the SEM3300 does exactly that.
Industrial applications require a high-magnification SEM for industrial use, and the SEM3300 meets this demand with its advanced SEM for precision imaging. Whether analysing microstructures in metallurgy, assessing semiconductor surfaces, or conducting surface morphology analysis, this system delivers clear and precise results. The reliable SEM for academic and industrial research ensures long-term performance, making it an excellent investment for research institutions and businesses alike.
The SEM3300 is also optimised as a cost-effective SEM for industrial applications, allowing manufacturers to integrate advanced SEM for quality control and inspection into their workflow without excessive costs. As industries continue to advance in materials science, semiconductor development, and nanotechnology, having a versatile SEM for materials science and engineering is crucial for innovation and production efficiency.
Overall, the CIQTEK SEM3300 is a high-resolution SEM with tungsten filament that bridges the gap between affordability and cutting-edge imaging performance. Whether you need a scanning electron microscope for failure analysis, academic research, or industrial quality assurance, the SEM3300 delivers exceptional results at a competitive price point.
"The CIQTEK SEM3300 is a high-resolution tungsten-filament SEM that achieves
field-emission-level imaging down to 2.5 nm."
Product FAQ's
The SEM3300 is a high-resolution tungsten filament scanning electron microscope designed for cost-effective imaging in research and industry.
Yes, it is a scanning electron microscope for failure analysis, allowing precise defect detection and quality control.
It is widely used in materials science, manufacturing, metallurgy, and semiconductor analysis for research and industrial applications.
Yes, it provides high-resolution SEM imaging with tungsten filament technology, ensuring accurate material analysis.
Yes, its intuitive design makes it an excellent entry-level SEM for research and education, suitable for students and professionals.
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