CIQTEK SEM4000X
The CIQTEK SEM4000X FE-SEM offers sub-nanometer resolution electron microscopy for high-precision research, materials science, and industrial applications.
Product Overview
The CIQTEK SEM4000X is a stable, versatile, flexible, and efficient field emission scanning electron microscope (FE-SEM). It achieves a resolution of 1.9nm@1.0kV, and easily tackles high-resolution imaging challenges for various types of samples. It can be upgraded with an ultra-beam deceleration mode to enhance low-voltage resolution even further.
The microscope utilises multi-detector technology, with an in-column electron detector capable of detecting SE and BSE signals while providing high-resolution performance. The chamber-mounted electron detector incorporates crystal scintillator and photomultiplier tubes, offering higher sensitivity and efficiency, resulting in stereoscopic images with excellent quality.
The graphic user interface is user-friendly, featuring automation functions such as automatic brightness & contrast, auto-focus, auto stigmator, and automatic alignment, allowing for rapid capture of high resolution images.
Features & Benefits
1.9 nm Resolution
Achieves high resolution for detailed nanoscale imaging.
Beam Deceleration Mode
Enhances low-voltage imaging with minimal sample damage.
In-Column Electron Detector
Detects secondary and backscattered electrons for enhanced analysis.
User-Friendly Operation
Modern user interface with advanced autofocus and auto-stigmation controls.
Key Features
- High Resolution: Achieves 1.9 nm resolution at 1.0 kV, facilitating detailed imaging of various samples.
- Ultra-Beam Deceleration Mode: Enhances low-voltage resolution for high-resolution imaging of delicate samples with minimal damage.
- In-Column Electron Detector: Detects secondary and backscattered electrons, providing high-resolution performance for comprehensive analysis.
- Multi-Detector Technology: Utilises multiple detectors to acquire abundant sample information, supporting diverse analytical needs.
- Excellent Expandability: Easily upgradeable with additional detectors and accessories to meet evolving research requirements.
- Large Sample Chamber: Accommodates samples up to 370 mm in diameter without the need for cutting, enhancing versatility.
- Five-Axis Fully Automated Sample Stage: Tilts from -10° to 75°, enabling multi-angle observations of different sample positions.
- User-Friendly Operation: Features a convenient operation system with high automation, simplifying sample movement and selection.
- Signal Mixing of SE and BSE Images: Combines secondary and backscattered electron signals for detailed image contrast and analysis.
- Stable Performance: Delivers consistent and reliable imaging results, essential for accurate material characterisation.
An Introduction to CIQTEK Scanning Electron Microscope SEM4000X
About the CIQTEK SEM4000X
The CIQTEK SEM4000X is a high-performance Field Emission Scanning Electron Microscope (FE-SEM) designed to deliver exceptional resolution and advanced capabilities for a wide range of applications, including nanotechnology, materials science, and semiconductor industries.
With an excellent 1.9 nm resolution at 1.0 kV, the SEM4000X enables precise imaging of nanoscale structures, offering detailed insights into materials at the atomic and molecular levels.
This level of resolution is crucial for applications such as semiconductor device analysis, nanomaterials research, and quality control in advanced manufacturing.
One of the key features of the SEM4000X is its ultra-beam deceleration mode, which enhances low-voltage imaging. This enables high-resolution imaging at lower accelerating voltages, reducing sample damage and providing a more accurate representation of delicate or beam-sensitive specimens. Low-voltage imaging is particularly useful for biological samples, thin films, or materials with sensitive coatings, ensuring their structural integrity while still obtaining high-quality images.
The microscope is equipped with an in-column electron detector that can capture both secondary electrons and backscattered electrons, allowing for comprehensive surface and compositional analysis. This capability is ideal for detailed examination of material properties, surface topography, and elemental contrast, enabling researchers to gain a deeper understanding of complex samples.
The SEM4000X is designed with user-friendly operation in mind. The system features an intuitive interface and automated functions, simplifying the process of sample imaging and positioning. Even users with limited experience can quickly operate the system, making it ideal for both novice and expert users alike.
Additionally, the SEM4000X offers excellent expandability, compatible with a wide range of detectors, accessories, and sample holders. This flexibility allows for customisation to meet the specific needs of various research applications.
Overall, the CIQTek SEM4000X combines cutting-edge technology, ease of use, and versatile capabilities to support a broad range of material analysis tasks, especially in low-voltage imaging scenarios.
"The CIQTEK SEM4000X is a versatile Schottky field-emission SEM delivering ultra-high-resolution imaging down to 1.9 nm at 1 kV with multi-detector capability.."
Product FAQ's
The SEM4000X offers high resolution electron microscopy at low voltages, making it ideal for imaging of delicate and sensitive samples.
The in-lens electron detector enhances image contrast and quality by efficiently detecting both secondary and backscattered electrons at low energies, providing superior surface and compositional analysis.
Deceleration improves image clarity at low voltages by reducing electron scattering and enhancing resolution, particularly when imaging delicate or insulating samples.
Yes, the SEM4000X is designed with a user-friendly interface and fully automated functions, making it easy to operate for both novice and experienced users.
The SEM4000X is ideal for a wide range of applications, including nanomaterials research, semiconductor analysis, material science, surface characterisation, failure analysis, and biological sample imaging, making it suitable for industries such as electronics, energy, and manufacturing.
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