CIQTEK SEM5000X
The CIQTEK SEM5000X FE-SEM delivers sub-nanometer resolution electron microscopy for precision imaging in nanotechnology, semiconductor analysis, and materials science.
Product Overview
The CIQTEK SEM5000X is an ultra-high-resolution FESEM designed for advanced research. It delivers 0.6 nm resolution, ideal for detailed nanoscale imaging. The in-lens detector enhances contrast and detection efficiency, while dual deceleration technology allows low-energy imaging with high resolution and minimal sample damage.
The retractable STEM detector supports advanced scanning transmission electron microscopy for comprehensive material analysis. With its eucentric stage design, the SEM5000X ensures smooth and stable sample movement, enabling precise imaging from multiple angles. This combination of features makes it a powerful tool for nanomaterials research and semiconductor manufacturing.
Features & Benefits
0.6 nm Resolution
Achieves ultra-high resolution for precise nanoscale imaging.
In-Lens Detector
Improves contrast and detection efficiency for clear, sharp images.
Dual Deceleration Technology
Enables low-energy imaging with high resolution and minimal sample damage.
Retractable STEM Detector
Provides advanced scanning transmission electron microscopy for material analysis.
Key Features
- Ultra-High Resolution: Achieves 0.6 nm resolution at 15 kV and 1.0 nm at 1 kV, enabling detailed visualization of nanoscale structures.
- In-Lens Detector: Enhances imaging contrast and detection efficiency for superior image quality.
- Retractable STEM Detector: Enables scanning transmission electron microscopy (STEM) imaging for enhanced material analysis.
- Stage and Beam Dual Deceleration Technology: Allows low-energy imaging, enhancing resolution and reducing sample damage.
- Optimized Electron Optics: Reduces overall aberrations by 30%, improving imaging performance.
- Double Cross-Over Column Design: Provides improved beam stability and resolution for precise imaging.
- Ideal for Nanomaterials Research: Facilitates detailed analysis of nano-structural materials, supporting cutting-edge research.
- Semiconductor Manufacturing Applications: Enables high-resolution imaging essential for semiconductor inspection and quality control.
- Eucentric Stage Design: Ensures smooth, stable sample movement for precise imaging at multiple angles. Ideal for EBSD.
An Introduction to CIQTEK Scanning Electron Microscope SEM5000X
About the CIQTEK SEM5000X
The CIQTEK SEM5000X FE-SEM is the pinnacle of ultra-high-resolution Field Emission Scanning Electron Microscopes (FE-SEM), designed for scientists, engineers, and researchers who require the most advanced electron microscopy capabilities.
With industries rapidly evolving in fields such as nanotechnology, semiconductor manufacturing, and materials science, the need for a sub-nanometer resolution electron microscopy system has never been more critical.
Many conventional electron microscopes struggle with resolution, contrast, and imaging speed, making them unsuitable for next-generation research and industrial applications.
The CIQTEK SEM5000X is an ultra-high-resolution Field Emission Scanning Electron Microscope (FE-SEM) designed for cutting-edge research in nanotechnology, material science, and semiconductor manufacturing.
Offering exceptional resolution of 0.6 nm at 15 kV and 1.0 nm at 1 kV, it allows users to capture detailed, high-quality images of nanoscale structures, providing critical insights into materials at the atomic level.
This makes the SEM5000X ideal for advanced research in nanomaterials, thin films, and other sophisticated materials.
The microscope features an in-lens detector, significantly enhancing contrast and imaging efficiency, ensuring the highest quality results even in challenging imaging conditions.
The dual deceleration technology integrated into the stage and beam system enables low-energy imaging, allowing for high-resolution imaging while minimising the risk of sample damage, making it perfect for delicate or sensitive specimens.
The retractable STEM detector provides scanning transmission capabilities, offering in-depth material analysis with greater precision.
This feature allows for advanced imaging at the atomic scale, enabling researchers to observe crystal structures, defects, and grain boundaries with exceptional clarity.
Equipped with an eucentric stage design, the SEM5000X ensures smooth, stable sample movement, maintaining precise imaging at various angles for high-accuracy results during tilt and rotation.
This design allows for the optimal alignment of samples and enables researchers to observe complex sample geometries from multiple perspectives.
The CIQTEK SEM5000X combines state-of-the-art technology with user-friendly features, including intuitive controls and automation, making it accessible for both experienced researchers and new users.
Its combination of high resolution, advanced features, and robust stability makes it a versatile tool for a wide range of applications, from semiconductor inspection to nanomaterials research, ensuring reliable and consistent results every time.
"The CIQTEK SEM5000X is an ultra-high-resolution Schottky field‑emission SEM achieving 0.6 nm resolution at 15 kV (1 nm at 1 kV)."
Product FAQ's
The SEM5000X offers ultra-high resolution of 0.6 nm at 15 kV and 1.0 nm at 1 kV, enabling precise imaging of nanoscale structures.
The in-lens detector enhances contrast and detection efficiency at low energies, providing clearer and more detailed images, even in low contrast or challenging sample conditions.
This FE-SEM is used for nanotechnology research, materials science, failure analysis, biological imaging, and industrial quality control.
The eucentric stage design enables stage tilting while maintaining the sample position, allowing for precise imaging at various angles, which is essential for high-throughput work and EBSD analysis.
Yes, it is a reliable ultra-high-resolution FE-SEM for industry and academia, designed for both experienced professionals and new researchers.
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