SciMed’s Dr Andrew Searle Visits CIQTEK for Advanced SEM Training

27th February 2026

SciMed’s Electron Microscopy expertise continues to strengthen.

Product Manager Dr Andrew Searle completes hands-on and theoretical SEM training at CIQTEK headquarters in China.

Earlier this month, Dr Andrew Searle, Product Manager for SEM and Ion-Beam Milling at SciMed, travelled to China to visit CIQTEK for in-depth technical training on their Scanning Electron Microscope range.

CIQTEK is a global developer and manufacturer of advanced scientific instruments, with Scanning Electron Microscopes (SEMs) representing one of its most established product areas. Its SEM portfolio spans from low-kV, high-resolution tungsten filament systems through to ultra-high-resolution Schottky field emission SEMs, as well as specialised platforms including FIB-SEM and high-volume SEM solutions.

The visit provided an opportunity to work directly with the engineers and product specialists behind the technology, gaining a deeper understanding of the design, configuration, and performance of CIQTEK’s SEM platforms.

Strengthening Technical Expertise in SEM

As SciMed continues to support advanced research across materials science, semiconductors, life sciences and failure analysis, maintaining strong technical alignment with key suppliers is essential.

During the visit, Andrew completed structured theoretical and hands-on training across the CIQTEK SEM range, covering:

  • Instrument configuration and column design, including source selection and column architecture
  • Detector technologies and imaging modes, including SE, BSE and EDS
  • Resolution optimisation and beam stability
    application-focused workflows for areas such as semiconductors and materials science
  • Service and support fundamentals

Working directly on the instruments provided valuable perspective beyond specification sheets and brochures, reinforcing SciMed’s ability to advise customers with practical, experience-led insight.

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Expert Insight

A First-Hand Perspective from the Demonstration Facility

Working in CIQTEK’s demonstration facility gave valuable insight into the operation, configuration, and practical application of the SEM systems. Seeing the instruments in use, and discussing their capabilities directly with the team, provided a clearer understanding of the platform and its relevance to real customer requirements.

Andrew commented:

“I’ve recently returned from CIQTEK in China, where I completed hands-on training on their Scanning Electron Microscope range.

The visit was a valuable opportunity to deepen my product knowledge, work closely with the team, and gain a much better understanding of the technology behind the instruments. Seeing the systems up close and learning directly from the people behind them was particularly useful.

What stood out to me was the breadth of the SEM portfolio, the technical capability of the systems, and the team’s strong focus on performance and application support.

For customers in the UK and Ireland, this training puts me in a stronger position to support discussions around system selection, applications, and technical fit. I’m grateful to the CIQTEK team for the warm welcome and the quality of the training provided, and I look forward to putting this knowledge into practice.”

ciqtek-quantum-diamond-series-display

What This Means for UK & Ireland Customers

For customers across the UK and Ireland, supplier visits such as this translate directly into stronger technical support, clearer application guidance, and greater confidence when selecting SEM solutions.

By investing time on-site with CIQTEK, SciMed ensures:

  • Closer technical collaboration with the manufacturer
    • Enhanced application understanding
    • Improved pre-sales consultation
    • More informed product recommendations
    • Stronger long-term customer support

This visit reflects SciMed’s ongoing commitment to providing technically robust, application-focused solutions in electron microscopy and advanced materials characterisation.

What Next?

If you would like to discuss your SEM or ion-beam milling requirements, contact Andrew Searle and the SciMed team for expert guidance tailored to your application.

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