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Bowman B Series XRF

Discover Bowman B Series XRF, a top-down measurement solution for accurate and budget-friendly XRF analysis.

Product Overview

The B Series XRF is Bowman’s entry level top-down measurement system.

It features a fixed sample stage for manual positioning of samples, single diameter fixed collimator and fixed focal distance as standard. It retains the slotted chamber design of the P Series, ideal for measurement of PCBs, and a high-resolution silicon drift detector.

The Bowman B Series is ideally suited to low testing volumes, larger finished parts with curved or profiled shapes, and large PCBs requiring simple spot checks.

Features & Benefits

Spacious sample chamber

140mm (H) x 310mm (W) x 335mm (D) sample capacity

High resolution camera

30x magnification camera for precise sample positioning

SDD detector as standard

High-resolution detector means futureproof analytical performance

Key features for Bowman B Series XRF

  • Top-down measurement configuration: ensures accurate and consistent measurements on large or profiled parts.
  • High-resolution SDD detector: capable of handling the most demanding coating applications.
  • Micro-focus X-ray tube: offers enhanced excitation intensity for faster measurement.
  • PCB industry standard compliance: Guaranteed to comply with IPC-4552, 4553, 4554 and 4556.
  • Plating industry compliance: Meets requirements of DIN EN ISO 3497 and ASTM B568.
  • Wide element range: Aluminium (Al) – uranium (U) analysis range.
  • Budget-friendly performance: fixed sample stage, fixed collimator and fixed focal distance offer a budget-friendly solution for low throughput applications.
  • Upgradeable: Upgradeable to multiple collimators and variable focal distances. Large-area SDD available for special applications.
  • Designed and manufactured in the USA: Trusted quality and origin.

Bowman B Series XRF Product Video

About the Bowman B Series XRF

In the demanding field of coating thickness measurement, the need for precise, reliable, and budget-friendly solutions has never been greater.

The Bowman B Series XRF provides just that: an entry point into top-down chamber configuration and the measurement flexibility that it offers, at an affordable price, and with no compromises on analytical performance.

The top-down chamber configuration allows more flexibility in positioning and measuring larger or profiled parts than with optics below. Whilst the fixed sample stage requires manual sample positioning, the standard high-resolution 30x magnification camera and laser auto-focus system mean that this process is still simple and fast. The standard fixed 0.3mm collimator and fixed focal distance offer a “no-frills” specification for applications where more complex features are simply not required. However, that does not mean the B Series compromises on quality or analytical performance. It comes as standard with the same long life micro-focus X-ray tube, high resolution SDD detector and Bowman Archer software platform found in higher-specification systems, which means that the B Series is capable of handling the most demanding of coating applications including complex multi-layer coatings. What’s more, the fixed collimator and fixed focal distance are both optionally upgradeable to provide that extra level of flexibility if required.

The Bowman B Series XRF is not just a product; it’s a comprehensive solution. With guaranteed compliance to PCB industry standards IPC-4552, 4553, 4554, and 4556, as well as compliance with general metal coating standards ASTM B568 and DIN EN ISO 3497, it stands as a testament to quality and reliability. Whether it’s spot checks on large PCBs, coating measurements on larger finished parts such as plumbing fittings or automotive components, or low-volume measurements on any plated parts, the Bowman B Series has it covered. Made in the USA, it ensures a level of quality and performance that sets it apart in the market.

Product Specifications

Element Range:

Aluminium 13 to Uranium 92

X-ray excitation:

50 W (50kV and 1mA) micro-focused W anode tube


Silicon solid state detector with 190eV resolution or better

Number of analysis
layers and elements:

5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 25 elements simultaneously


4 primary filters/single motorized collimators

Focal Depths:

Fixed focal depths with laser (optional multi focal)

Digital Pulse Processing:

4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction


Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 10 Prof, 64-bit equivalent

Camera optics:

1/4″ (6mm) CMOS-1280×720 VGA resolution

Video Magnification:

30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional

Power Supply:

150W, 100-240 volts, with frequency range of 47Hz to 63Hz



Standard Motorized/ Programmable XY:

Table size: Not available

Extended Programmable XY:

Table size: Not available

Internal Dimensions:

Height: 140mm (5.5″), Width: 310mm (12″), Depth: 335mm (13″)

External Dimensions:

Height: 450mm (18″), Width: 450mm (18″), Depth: 600mm ( 24″)


"The B Series provides an entry point into flexible top-down XRF
measurement at a budget-friendly price"

Product FAQ's

The combination of top-down measurement configuration, close-coupled optics, high-resolution SDD detector and budget-friendly price make the Bowman B Series unique.

Yes, it offers an ideal solution for low-volume testing requirements.

Yes, the fixed collimator, fixed focal distance and detector can all be upgraded to fit your specific requirements.

It complies with IPC-4552, 4553, 4554, and 4556, as well as ASTM B568, and DIN EN ISO 3497 XRF standards.

The Bowman B Series XRF equipment is made in the USA

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