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Bowman P Series XRF 2

Bowman P Series XRF

The Bowman P Series XRF offers high precision XRF analysis with a programmable X-Y stage, suitable for various applications.

Product Overview

The Bowman P Series XRF is a versatile and flexible analyser designed to measure a wide variety of sample sizes, shapes, and quantities.

Equipped with a high-precision motorised X-Y stage, it provides pinpoint control for testing critical areas on parts.

With multi-point programming for automated high-throughput applications, state-of-the-art optics and compliance with global standards, it’s an essential tool for applications such as PCB testing, electrical connectors, and a wide range of high-throughput plating applications.

Features & Benefits

Bowman P Series XRF 2

Programmable X-Y Stage

Precise control and automated measurements

Top-down measurement configuration

Most flexible configuration for wide range of samples

Spacious sample chamber

140mm (H) x 310mm (W) x 335mm (D) sample capacity

Slotted chamber design

Ideal for printed circuit boards

Key features of Bowman P Series XRF

  • High resolution SDD detector: capable of handling the most demanding coating applications.
  • Micro-focus X-ray tube: offers enhanced excitation intensity for faster measurement.
  • PCB industry standard compliance: Guaranteed to comply with IPC-4552, 4553, 4554 and 4556.
  • Plating industry compliance: Meets requirements of DIN EN ISO 3497 and ASTM B568.
  • Wide element range: Aluminium (Al) – uranium (U) analysis range.
  • Programmable motorised X-Y stage: precise sample positioning and multi-point measurement. Ideal for small features on PCBs or automating multiple measurement points.
  • Multiple focal depths with laser autofocus: 6mm – 64mm focal depth range for measurement into recessed sample areas.
  • Multiple collimators: 4 collimators for flexibility in spot size. Options include large collimators for plating bath analysis.
  • Upgradeable: Extended sample stage options for large PCBs. Large-area SDD available for special applications.
  • Designed and manufactured in the USA: Trusted quality and origin.

Bowman P Series XRF Product Video

About the Bowman P Series XRF

As more and more industries turn to benchtop XRF as a means of product quality testing, the need for a flexible, high-specification system has never been greater. The Bowman P Series XRF emerges as a solution to this growing need across a wide range of industries. State-of-the-art optics, highly flexible configuration and automated measurement features are all bundled into a compact footprint.

The P Series XRF boasts a wide range of advanced features as standard. The fully programmable X-Y stage allows automation of multi-point measurements or batched samples.

This is further augmented with advanced software features such as sample pattern recognition which automatically picks out the same features on a PCB or other sample.

The variable focal range of 6mm – 64mm allows measurement into recessed sample areas. The long-life 50W micro-focus X-ray tube, close-coupled optics, high-throughput SDD detector and one-touch autofocus combine to offer the fastest possible measurement times. A high resolution 30x magnification camera gives precise sample imaging for positioning and results traceability.

All the above, combined with Bowman’s guaranteed compliance with standards such as IPC-4552, 4553, 4554, 4556, ASTM B568 and DIN EN ISO 3497 make the P Series the ideal choice for PCB manufacturing and provide a reliable, adaptable, and efficient solution for many other industries.

Product Specifications

Element Range:

Aluminium (Al) to Uranium (U)

X-ray excitation:

50 W (50kV and 1mA) micro-focused W anode tube


Silicon solid state detector with 190eV resolution or better

Number of analysis
layers and elements:

5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 25 elements simultaneously


4 primary filters / 4 motorized collimators

Focal Depths:

Multi fixed focal depths with laser

Digital Pulse Processing:

4096 CH digital multi-channel analyser with flexible shaping time; automatic signal processing including dead time correction and escape peak correction


Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 10 Prof, 64-bit equivalent

Camera optics:

1/4″ (6mm) CMOS-1280×720 VGA resolution

Video Magnification:

30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional

Power Supply:

150W, 100-240 volts, with frequency range of 47Hz to 63Hz

Working Environment:

50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing



Programmable XY:

Table size: 381mm (15″) x 310mm (13″) | Travel: 152mm (6″) x 127mm (5″)

Extended Programmable XY:

Table size: 635mm (25″) x 635mm (25″) | Travel: 254mm (10″) x 254 (10″)

Now available with extended stage option

Internal Dimensions:

Height: 140mm (5.5″), Width: 310mm (12″), Depth: 340mm (13″)

External Dimensions:

Height: 450mm (18″), Width: 450mm (18″), Depth: 600mm (24″)

"The P Series: Precision and versatility for diverse sample
measurements with an advanced programmable stage."

Product FAQ's

IPC-4552 compliance, programmable X-Y stage and multi-point measurement capabilities with pattern recognition software make it ideal for PCB testing.

Yes, it complies with IPC-4552, 4553, 4554, and 4556, ASTM B568, and DIN EN ISO 3497 standards.

There are multiple upgrade options including extended travel sample stages for PCB testing, large area SDD detector for special applications and multiple collimator sets for specific customer needs.

It can analyse elements ranging from Aluminum (Al) to Uranium (U).

The Bowman P Series XRF is designed and manufactured in the USA.

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