Rigaku NEX DE
60 kV EDXRF for high-performance results when analysis time or sample throughput is critical or when small spot analysis is required
Product Overview
NEX DE Series elemental analyzers deliver high-performance results when analysis time or sample throughput is critical. These instruments provide expanded analytical capabilities, including higher sample batch throughput, small spot analysis, or enhanced performance for measurement of higher atomic number elements.
Features & Benefits
Superior SDD Resolution
Broad Na to U Coverage
Intuitive QuantEZ Software
Key applications
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Solids, liquids, alloys, powders and thin films
• High-performance SDD for superior data
• Unmatched performance-to-price ratio
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• 60 kV X-ray tube for wide elemental coverage
• Multiple automated tube filters for enhanced sensitivity
• Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
• SureDI support for 21 CFR Part 11 compliance
• High-res camera and automated collimators for accurate sample positioning (NEX DE VS)
• Analyze 1 mm, 3 mm, and 10 mm spot sizes (NEX DE VS)
Rigaku NEX DE Product Video
About the Rigaku NEX DE
The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers. These instruments provide rapid, non-destructive elemental analysis of sodium to uranium in almost any sample type.
NEX DE Series spectrometers have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-throughput silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates deliver low limits of detection and provide excellent spectral resolution. Combined with the powerful QuantEZ software, these features provide unparalleled performance.
For applications requiring small spot analysis, the NEX DE VS model offers a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes.
Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE Series spectrometers deliver quick, high-performance results without complex setups.
Models include NEX DE and NEX DE VS.
NEX-DE VS
The NEX-DE VS is a specially modified version of the NEX-DE.
This special version has variable meaurment spots as well as a camera, which together enable the user to observe the section of the sample which will be measured as well as choose the actual size of the measurement area.
Features:
- Analyze ₁₁Na to ₉₂U non-destructively
- 1, 3 and 10 mm spot sizes, software selectable
- High resolution imaging for accurate sample positioning
- Powerful QuantEZ Windows®-based software
- Solids, liquids, alloys, powders and thin films
- 60kV X-ray tube for wide elemental coverage
- FAST SDD® detector for superior counting statistics
- Multiple automated tube filters for enhanced sensitivity
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters software
- Optional standardless fundamental parameters software
Specifications
| Technique | Direct excitation energy dispersive X-ray fluorescence (EDXRF) | |
|---|---|---|
| Benefit | High-performance results when analysis time or sample throughput is critical; analyze solids, liquids, powders, coatings, and thin films | |
| Technology | Energy dispersive XRF (EDXRF) using high-performance silicon drift detector (SDD) | |
| Attributes | 60 kV 12 W X-ray tube with automated tube filters, high-performance SDD, analyze Na to U | |
| Software | QuantEZ for control of spectrometer functions and data analysis | |
| Options | Vacuum, helium purge, automatic sample changers, single-position sample spinner, external PC with Microsoft® Windows® operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features | |
| Dimensions | 356 (W) x 260 (H) x 351 (D) mm | |
| Mass | Approx. 27 kg (core unit) | |
| Power requirements | 1Ø, 100 – 240 V, 1.5 A (50/60 Hz) | |
"The Rigaku NEX DE offers unmatched EDXRF analysis precision and speed,
setting new standards in elemental quantification."
Product FAQ's
It can analyse a wide range of samples, including solids, liquids, and thin films, without compromising sample integrity.
The SDD offers enhanced sensitivity and resolution, allowing for more precise and quicker elemental analysis.
Thanks to the intuitive QuantEZ software, users can perform complex analyses with minimal training. User training is included with the sales of every NEX-DE.
Absolutely, its high precision and wide elemental coverage make it suitable for meeting strict regulatory standards.
Its combination of high-resolution analysis, non-destructive testing, and ease of use offers significant long-term value and versatility.
Applications
Application Note 1
Application Note 2
Application Note 3
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