SNE-ALPHA
Research-grade electron optics with desktop simplicity: the SNE-Alpha delivers ultra-high resolution and rapid, high-throughput sample processing right to your lab bench.
Product Overview
The SNE-Alpha is SEC’s flagship desktop Scanning Electron Microscope (SEM), engineered to bridge the gap between benchtop accessibility and floor-model performance. Operating across a wide 1kV to 30kV accelerating voltage range, it delivers a best-in-class 5 nm resolution and up to 250,000x magnification without requiring a dedicated microscopy suite or specialised facility infrastructure.
Equipped with the third-generation Nano-Eye software suite, the system features an overhauled, intuitive interface that displays imaging results up to 60% faster than previous models.
Features & Benefits
Ultra-Clear Resolution
Achieve 5 nm resolution
Compact Design
40% dimension reduction
Enhanced Interface
View results 60% faster
Key features & benefits
- Unmatched Throughput & Speed
Achieve standard operating vacuum in just 90 seconds and vent in 15 seconds—reducing sample cycle times by 50% compared to typical desktop systems to keep busy high-volume batch workflows moving.
- Gentle, Low-Voltage Imaging
With true low-voltage capability down to 1kV and adjustable low-vacuum modes, the SNE-Alpha allows you to image non-conductive, biological, or highly fragile samples without devastating beam damage. Capture pristine, true-to-life surface details on charging samples without the strict requirement for conductive sputter coating.
- True 5-Axis Motorized Control
The standard, fully motorized 5-axis stage (X, Y, Z, Rotation, Tilt) allows precise, high-navigation sample positioning with less than 5 µm error, making complex fracture surface and failure analysis effortless.
- Advanced Automation and Detection
A revamped automatic shooting mode featuring newly integrated Auto-Gun-Align and advanced Auto Focus lets multi-user labs capture pristine secondary electron (SE) or backscattered electron (BSE) images with minimal training.
- Expanded Scalability
A large-capacity chamber accommodates samples up to 80mm in diameter, while built-in automated image stitching allows for seamless, large-area panoramic scans
The SNE-ALPHA by SEC
About the SNE-ALPHA
The SNE-ALPHA is a revolutionary tabletop Scanning Electron Microscope (SEM) developed by SEC. It is designed to address the challenges faced by professionals in conducting both detailed particle size analysis and 3D rendering.
Traditional SEMs often fall short in terms of user convenience and resolution clarity. The SNE-ALPHA bridges this gap by offering optimized user convenience and improved ultra-clear resolution. One of its standout features is the ability to achieve a 5 nm resolution, which is 250,000 x times, magnification, higher than any other tabletop SEMs.
This precise control of the lens allows for optimal image capture without damaging samples. Additionally, the compact design of the SNE-ALPHA, which has a 40% dimension reduction compared to previous models, allows it to be installed in the smallest of laboratories with ease. The dramatically enhanced interface, with optimal adjustability, enables results to be viewed 60% faster than previous software.
Moreover, the upgraded automatic functions, such as the newly added Auto-Gun-Align and enhanced Auto Focus, enable users to capture images with ease.
The image stitching feature allows for the capture of a wider range of images with large area scans, and an option for Back Scattered Electron (BSE), enabling a larger area of the sample to be selected that could not previously be captured in a single SEM image. Lastly, the 3D rendering functions allow for the inspection and analysis of the surface roughness of samples with ease and comfort.
All these standard features directly benefit the customer by making the process of particle size analysis and 3D rendering more efficient and convenient. x
5nm Resolution 250,000 x Magnification
High-precision navigation movement with an error rate of less than 5 um Standard, one-of-a-kind 5-axis motor stage
Experience the clarity of 5 nm resolution, which is 250,000 x times, more magnified than the leading tabletop SEM available today. The precise lens control ensures optimal imaging without causing any harm to the samples.
Save Time on Sample Preparation
Newly introduced in 2023, the SNE-Alpha enhances
our existing range of tabletop SEMs by offering enhanced
user-friendliness and superior, ultra-high definition resolution.
Space-Saving Structure
The design is not only compact and organized, but it also requires less space for installation. Compared to its predecessors, its dimensions are reduced by 40%, making the SNE Alpha suitable for even the smallest laboratories. Dimensions: 300(W) x 465(D) x 600(H) mm.
Introducing the third generation of Nano-Eye software
Featuring a significantly improved interface, effortlessly capturing images with a revamped and more intuitive UI.
Thanks to its optimal adjustability, the results can be accessed 60% quicker than with the previous software versions.
Enhanced Automatic Features
The recently incorporated Auto-Gun-Align feature simplifies the process of image capture for users.
The improved Auto Focus function allows users to accurately identify and capture the images they want.
Image Compilation
Capture a broader spectrum of images
- Scanning large areas is essential for converting extensive samples into images for analysis.
- Optional: BSE
- Enables selection of a larger sample area that was previously impossible to capture in a single SEM image.
3D Visualization
Inspect and analyse surface topography of samples with ease and comfort with our newly equipped 3D rendering functions.
Product FAQ's
The SNE-ALPHA offers a 5 nm resolution, which is 250,000 times magnification higher than current best-in-class tabletop SEMs.
Yes, the SNE-ALPHA comes with upgraded automatic functions, including the newly added Auto-Gun-Align and enhanced Auto Focus.
Yes, the image stitching feature of the SNE-ALPHA allows for the capture of a wider range of images with large area scans and an option for Back Scattered Electron (BSE).
Yes, the SNE-ALPHA comes with 3D rendering functions that allow for the inspection and analysis of the surface topography of samples with ease and comfort.
Yes, the compact design of the SNE-ALPHA, which is a 40% dimension reduction compared to previous models, allows it to be installed in the smallest of laboratories with ease.
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