Optimised user convenience with ultra-clear resolution in particle size analysis and 3D rendering.
Product Overview
The SNE-ALPHA by SEC is a brand-new tabletop Scanning Electron Microscope (SEM) designed to bring optimized user convenience and improved ultra-clear resolution. This smart tabletop SEM features software updates to five convenient automatic features, making it easier to conduct analysis.
New features such as particle size analysis and 3D rendering expand the range of potential user applications. With a high-precision navigation movement, it offers a unique, one-of-a-kind 5-axis motor stage and 5-nanometer resolution.
Features & Benefits
Ultra-Clear Resolution
Achieve 5 nm resolution
Compact Design
40% dimension reduction
Enhanced Interface
View results 60% faster
Key features & benefits
The SNE-ALPHA by SEC
About the SNE-ALPHA
The SNE-ALPHA is a revolutionary tabletop Scanning Electron Microscope (SEM) developed by SEC. It is designed to address the challenges faced by professionals in conducting detailed particle size analysis and 3D rendering.
Traditional SEMs often fall short in terms of user convenience and resolution clarity. The SNE-ALPHA bridges this gap by offering optimized user convenience and improved ultra-clear resolution. One of its standout features is the ability to achieve a 5 nm resolution, which is 150,000 times magnification higher than the current best-in-class tabletop SEMs.
This precise control of the lens allows for optimal image capture without damaging samples. Additionally, the compact design of the SNE-ALPHA, which is a 40% dimension reduction compared to previous models, allows it to be installed in the smallest of laboratories with ease. The dramatically enhanced interface, with optimal adjustability, enables results to be viewed 60% faster than previous software.
Moreover, the upgraded automatic functions, such as the newly added Auto-Gun-Align and enhanced Auto Focus, enable users to capture images with ease.
The image stitching feature allows for the capture of a wider range of images with large area scans and an option for Back Scattered Electron (BSE), enabling a larger area of the sample to be selected that could not previously be captured in a single SEM image. Lastly, the 3D rendering functions allow for the inspection and analysis of the surface roughness of samples with ease and comfort.
All these features directly benefit the customer by making the process of particle size analysis and 3D rendering more efficient and convenient.
5nm Resolution 250,000x Magnification
High-precision navigation movement with an error rate of less than 5 um Standard, one-of-a-kind 5-axis motor stage
Experience the clarity of 5 nm resolution, which is 150,000 times more magnified than the leading tabletop SEM available today. The precise lens control ensures optimal imaging without causing any harm to the samples.
The design is not only compact and organized, but it also requires less space for installation. Compared to its predecessors, its dimensions are reduced by 40%, making the SNE Alpha suitable for even the smallest laboratories. Dimensions: 300(W) x 465(D) x 600(H) mm.
Featuring a significantly improved interface, Effortlessly capture images with a revamped and more intuitive UI.
Thanks to its optimal adjustability, the results can be accessed 60% quicker than with the previous software versions.
The recently incorporated Auto-Gun-Align feature simplifies the process of image capture for users.
The improved Auto Focus function allows users to accurately identify and capture the images they want.
Capture a broader spectrum of images
· Scanning large areas is essential for converting extensive samples into images for analysis.
· Optional: BSE
· Enables selection of a larger sample area that was previously impossible to capture in a single SEM image.
Inspect and analyze surface roughness of samples with ease and comfort with our newly equipped 3D rendering functions.
The SNE-ALPHA offers a 5 nm resolution, which is 150,000 times magnification higher than current best-in-class tabletop SEMs.
Yes, the SNE-ALPHA comes with upgraded automatic functions, including the newly added Auto-Gun-Align and enhanced Auto Focus.
Yes, the image stitching feature of the SNE-ALPHA allows for the capture of a wider range of images with large area scans and an option for Back Scattered Electron (BSE).
Yes, the SNE-ALPHA comes with 3D rendering functions that allow for the inspection and analysis of the surface roughness of samples with ease and comfort.
Yes, the compact design of the SNE-ALPHA, which is a 40% dimension reduction compared to previous models, allows it to be installed in the smallest of laboratories with ease.
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