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L Series open chamber

Bowman L Series XRF

The Bowman L Series XRF offers the largest chamber design and multiple options for ultimate versatility.

Product Overview

The L Series XRF is Bowman’s largest chamber benchtop XRF system. It combines all the advanced features of the P Series with a large, fully enclosed sample chamber and greater X-Y stage travel.

Ideal for samples larger than 12 inches on any dimension, the L Series offers a solution for large parts or fixtures holding multiple parts. An optional RoHS application package provides a turnkey solution for RoHS compliance testing.

Combined with adherence to international testing standards, it offers the ultimate in flexibility for both coating thickness measurement and RoHS testing.

Features & Benefits

L Series open chamber

Large, enclosed sample chamber

Ideal for very large samples

Large X-Y stage travel

Multi-point measurements over a larger area

Optional RoHS package

Turnkey solution for RoHS testing needs

Dual-camera option

Additional wide view camera for simple whole-sample navigation

Key features of Bowman L Series XRF

  • Largest chamber: sample chamber internal dimensions 550mm (W) x 600mm (D) x 280mm (H) (300mm (H) with X-Y stage removed).
  • High resolution SDD detector: capable of handling the most demanding coating applications.
  • Micro-focus X-ray tube: offers enhanced excitation intensity for faster measurement.
  • PCB industry standard compliance: Guaranteed to comply with IPC-4552, 4553, 4554 and 4556.
  • Plating industry compliance: Meets requirements of DIN EN ISO 3497 and ASTM B568.
  • Wide element range: aluminium (Al) – uranium (U) analysis range.
  • Programmable motorised X-Y stage: Massive 250mm x 250mm X-Y stage travel, allows precise sample positioning and multi-point measurement. Ideal for automating multiple measurement points.
  • Multiple focal depths with laser autofocus: 6mm – 64mm focal depth range for measurement into recessed sample areas.
  • Multiple collimators: 4 collimators for flexibility in spot size. Options include large collimators for plating bath analysis.
  • Upgradeable: Optional RoHS package provides turnkey solution for RoHS testing. Large-area SDD available for special applications.
  • Designed and manufactured in the USA: Trusted quality and origin.

Bowman L Series XRF Product Video

About the Bowman L Series XRF

XRF has become widely recognised as the ideal solution for non-destructive coating thickness measurement. But what if you need to test large parts? The Bowman L Series XRF offers a large chamber solution that allows this industry-standard technique to be applied even to larger plated items.

Boasting a large, fully-enclosed sample chamber, the L series can handle samples up to 550mm x 600mm x 250mm as standard.

The fully programmable X-Y stage expands upon the capacity of the P Series by offering an increased X-Y travel, allowing multi-point measurement over a wider area without the need to re-position samples.

This feature also facilitates the measurement of larger batches of small samples where very high throughput is required. 

L Series open chamber

All the advanced features found on the P Series are retained: micro-focus X-ray tube, variable focal distances, variable collimator sizes, high-throughput SDD detector, laser auto-focus and 30x magnification camera.

In addition, an optional wide view camera allows the user to capture a whole-table image for ease of navigation across large samples. There is also an optional vacuum chuck for light element measurement on silicon wafer applications, and an optional RoHS application package that provides a turnkey solution for RoHS compliance testing.

All the above, combined with Bowman’s guaranteed compliance with standards such as IPC-4552, 4553, 4554, 4556, ASTM B568 and DIN EN ISO 3497 make the L Series the ultimate in flexibility for all your coating application needs.

Product Specifications

Element Range:

Aluminium 13 to Uranium 92

X-ray excitation:

50 W (50kV and 1mA) micro-focused with anode tube

Detector:

Silicon solid state detector with 190eV resolution or better

Number of analysis
layers and elements:

5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 25 elements simultaneously

Filters/Collimators:

4 primary filters / 4 motorized collimators

Focal Depths:

Multi fixed focal depths with laser

Digital Pulse Processing:

4096 CH digital multi-channel analyzer with flexible shaping time; automatic signal processing including dead time correction and escape peak correction

Computer:

Intel, CORE i5 3470 Processor (3.2GHz), 8GB DDR3 Memory, Microsoft Windows 10 Prof, 64-bit equivalent

Camera optics:

1/4″ (6mm) CMOS-1280×720 VGA resolution

Video Magnification:

30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional

Power Supply:

150W, 100-240 volts, with frequency range of 47Hz to 63Hz

Working Environment:

50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing

Weight:

110kg

Programmable XY:

Table size: 254mm (10″) x 254mm (10″) | Travel: 254mm (10″) x 254mm (10″)

Internal Dimensions:

Height: 280mm (11″), Width: 550mm (22″), Depth: 600mm (24″)

External Dimensions:

Height: 750mm (30″), Width: 700mm (28″), Depth: 750mm (30″)

 

"The L Series: Versatile, large-chamber XRF for big samples,
with extensive customisation options."

Product FAQ's

Yes, the has the largest chamber design and X-Y stage travel which allow for both large parts or large sample fixtures holding multiple parts to be measured.

Yes, the optional factory-calibrated RoHS package provides a turnkey solution for RoHS testing needs.

Yes, the system offers a variety of optional upgrades, including large-area SDD detector, vacuum chuck for silicon wafer applications, wide-view camera for whole-sample navigation

Yes, all Bowman XRF systems are fully compliant with IPC-4552, 4553, 4554, and 4556, ASTM B568, and DIN EN ISO 3497 standards.

The Bowman L Series XRF is designed and manufactured in the USA.

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