Rigaku NEX CG II Series
High-performance indirect excitation EDXRF for complex applications with trace elements and variable base matrices
Product Overview
NEX CG II Series spectrometers solve elemental analysis challenges using a unique Cartesian Geometry optical kernel for the highest sensitivity. These instruments are ideal for ultra-low and trace-level performance, excelling at complex applications with trace elements and variable base matrices.
Features & Benefits
Enhanced Sensitivity and Precision
Preserves Sample Integrity
Accurate Wide Elemental Range
Key applications
• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Quick elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• SureDI support for 21 CFR Part 11 compliance
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership
Rigaku NEX CG II Product Video
About the Rigaku NEX CG II
The Rigaku NEX CG II Series are powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometers. They perform rapid qualitative and quantitative elemental analyses and address needs across many industries. NEX CG II Series spectrometers serve a broad range of applications and are ideal for measuring ultra-low and trace element concentrations up to percent levels.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, the NEX CG II Series spectrometers bring a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.
Models include NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more demanding applications requiring a higher-powered system.
NEX CG II Series spectrometers are well suited for the following applications:
• Agricultural soil and plant materials
• Finished animal feeds
• Waste oils
• Environmental monitoring
• Pharmaceuticals and cosmetics
• Catalysts
• Monitoring for toxic metals in aerosols on air filters
• Trace heavy metals and rare earth elements (REE)
• Other applications that require a high degree of sensitivity
Polarized X-ray optics using 3D Cartesian Geometry (CG)
The prime reason for applying a Cartesian Geometry and therefore polarising the optics is to eliminate the spectral background caused by back scattered X-rays. Just as polarised lenses in sunglasses remove the glare from the sun reflections, so polarized x-rays from the 3D configuration no longer back-scatter into the detector.
This leads to up to 10 times more sensitive analysis and therefore sub ppm LOD’s rather than low ppm. The NEX CG II uses new designed close-coupled Cartesian Geometry (CG) to improve the performance of the detection limits for both light and heavy element range ranges.
| Technique | Indirect excitation energy dispersive X-ray fluorescence (EDXRF) | |
|---|---|---|
| Benefit | Excel in complex applications with trace elements and variable base matrices; analyze solids, liquids, powders, coatings, and thin films | |
| Technology | 3D Cartesian geometry energy dispersive XRF (EDXRF) using a large-area high-throughput silicon drift detector (SDD) | |
| Attributes | High-power X-ray tube (50 kV 50 W or 65 kV 100 W), large-area high-throughput SDD, analyze Na to U | |
| Software | QuantEZ for control of spectrometer functions and data analysis | |
| Options | Vacuum, helium purge, automatic sample changers, sample spinner tray, external PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features | |
| Dimensions | 46.3 (W) x 49.2 (D) x 38.2 (H) cm | |
| Mass | Approx. 65 kg (NEX CG II); approx. 68 kg (NEX CG II+) | |
| Power requirements | 1Ø, 100 – 240 V, 3.8 – 1.6 A (50/60 Hz) or 100 – 240 V, 5.2 – 2.6 A (50/60 Hz) | |
"The Rigaku NEX CG II redefines EDXRF with its exceptional sensitivity and versatility,
making it ideal for trace element analysis in a wide range of materials."
Product FAQ's
Suitable for environmental monitoring, quality control, research and development, and more, due to its wide elemental coverage and high sensitivity.
Yes, it’s designed for the analysis of solids, liquids, and even thin films, offering versatile sample handling.
It increases the sensitivity and precision of the analysis, allowing for lower detection limits and faster results.
Its combination of non-destructive testing, advanced software, and high precision across a broad elemental range sets it apart.
Absolutely, with the QuantEZ software and RPF-SQX algorithms, it offers a simplified user interface for complex analyses.
Applications
Application Note 1
Application Note 2
Application Note 3
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